| Impact of low energy electrons using different parameters of track structure simulation and atomistic model on DNA strand breaks |
| Paper ID : 1024-ISCH |
| Authors |
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mariam Mohamed Salama *1, Magdy Mohamed Khalil2, Mona Moustafa3, Mohamed ALY3 1School of Biotechnology- Badr University 2School of Applied Health Sciences, Badr University in Cairo (BUC), Badr City and Department of Physics, Faculty of Science, Helwan University, Cairo, Egypt. 3Faculty of Science, Helwan University |
| Abstract |
| Aim. Low energy electrons play a significant role in the biological damage of ionizing radiation. The aim of this work was to characterize the effect of track structure parameters on the damage of DNA. Methods. Atomistic DNA and track structure physics models were utilized to analyze DNA molecular damage including SSB and DSB. Simulations included base pairs cutoff of 10, 12 and 14 and incident electron energy of 0.04 -5 keV and an incident beam of 5x103 to 105 electrons were conducted Results: The maximum yield of SSB and DSB occurred at the range of 300-600 eV, with the highest yields occurring at 400 eV and 500 eV. The SSB/DSB ratio declines with increasing incident energy; it reaches its maximum at 100 eV and minimum at 600 eV. In addition, the SSB/DSB ratio gradually becomes less visible when the cutoff energy decreases from 20 eV to 8.22 eV. Conclusion: The electron energy range of 100–600 eV was found very effective in DNA damage. Furthermore, data analysis indicates that between 300 and 600 eV is the most prevalent energy range for direct SSBs and DSBs. While increasing the electron energy cut-off from 10 to 20 eV significantly reduces the amount of SSBs and DSBs per electron while lower energy and base pair cut-offs result in more damage. |
| Keywords |
| single Strand Break, Double Strand Break, Low energy electron |
| Status: Abstract Accepted (Poster Presentation) |